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Microelectronics, electromagnetism, photonics , microwave

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Measurements of the transport properties

At room temperature, we're able to characterize on-wafer directly thanks to:
 
  • A manual probe test bench for resistivity and Hall effect measurement
     
Concerning the low temperature measurements, two possibilities:
  • A cryostat for Hall effect measurement on DIL packaged samples (15K->400K and Bmax=0.85 T).  
     
  • A test bench for Hall effect measurement, plus the possibility to get magnetic-resistance measurements thanks to a high applied magnetic field (up to 9T) on PLCC (24 pin) packaged devices. (Temperature range: from 2K up to 400K).
Hall effect measurement,Hall effect measurement

Date of update May 17, 2019

French
IMEP-LAHC
Grenoble site
Grenoble INP - Minatec : 3, Parvis Louis Néel - CS 50257 - 38016 Grenoble Cedex 1

Chambéry site
Université de Savoie Mont Blanc - F73376 Le Bourget du Lac Cedex
 
 
  CNRS  http://www.cnrs.fr      Site Grenoble-INP http://www.grenoble-inp.fr       Université Grenoble Alpes (UGA)      Université Savoie Mont Blanc
Univ. Grenoble Alpes