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Microelectronics, electromagnetism, photonics , microwave
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Measurements of the transport properties

At room temperature, we're able to characterize on-wafer directly thanks to:

  • A manual probe test bench for resistivity and Hall effect measurement
Concerning the low temperature measurements, two possibilities:

  • A cryostat for Hall effect measurement on DIL packaged samples (15K->400K and Bmax=0.85 T).  
  • A test bench for Hall effect measurement, plus the possibility to get Mesure Effet Hallmagnetic-resistance measurements thanks to a high applied magnetic field (up to 9T) on PLCC (24 pin) packaged devices. (Temperature range: from 2K up to 400K).

Date of update June 18, 2009

Grenoble site
Grenoble INP - Minatec : 3, Parvis Louis Néel - CS 50257 - 38016 Grenoble Cedex 1

Chambéry site
Université de Savoie - F73376 Le Bourget du Lac Cedex

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Univ. Grenoble Alpes