A wide range of equipments is at lab's researchers' disposal to cover all their needs for passive or active devices characterizations, for experimental validation of theoretical models and for new architectures design in telecommunication systems.
These equipments are organized under three themes
Other characterization tools are also available. For example, noise measurement up to 26GHz is proposed for noise figure or noise parameters extraction. Furthermore, we have solutions for spectral characterization up to 75GHz and for sub nanosecond time domain measurement.
For on wafer devices, two probe stations can be coupled with measurement equipments.
Date of update October 5, 2018