At room temperature, we're able to characterize on-wafer directly thanks to:
A manual probe test bench for resistivity and Hall effect measurement
Concerning the low temperature measurements, two possibilities:
A cryostat for Hall effect measurement on DIL packaged samples (15K->400K and Bmax=0.85 T).
A test bench for Hall effect measurement, plus the possibility to get magnetic-resistance measurements thanks to a high applied magnetic field (up to 9T) on PLCC (24 pin) packaged devices. (Temperature range: from 2K up to 400K).