This measurement bench allows the characterization of the gain or loss of an optical chip with advanced tools:
High stability optical breadboard of with stereomicroscope
6 axis positioning stage with piezoelectric drives
Calibrated InGaAs optical power meter
Optical spectrum analyzer with high resolution
High power pump Laser and calibrated sources.
Mode profile
This optical bench allows to measuring the intensity of the guided mode of the integrated chips realized at our laboratory. The equipments available for this bench are:
High stability optical breadboard of with stereomicroscope
5 axis positioning stages with high precision
InGaAs CCD camera allowing the visualization of optical fields at a working wavelength up to 1.7 microns.
M-lines
This measurement bench allows to characterizing by the black lines method, the effective index of a waveguide. Combined with the inverse WKB method, these measures allow to determining the index profile of the waveguides realized by ions exchange. This bench contains:
Optical breadboard with high stability
Optical goniometer with high resolution
Optical lenses and HeNe LASER.
Spectrum analysis
This measurement bench allows to measuring the transmission spectra of integrated waveguides with advanced tools:
Optical breadboard with high stability and stereomicroscope
3 axis positioning stages high precision
High resolution spectrum analyzer
Wide band tungsten source
Bragg grating
This bench allows to realizing and to characterizing Bragg gratings with a submicron step by means of advanced equipments:
Active vibration isolated optical breadboard and laminar flow
High power argon ion laser + Titanium sapphire laser