Four Vector Network Analyzers cover a wide frequency domain from radio to millimetric waves. These equipments allow small signal frequency characterization for passive and active devices which can be planar, coaxial or packaged. A very wide band measurement system allows 40MHz to 110GHz full characterization with only one sweep in coaxial mode.
Other characterization tools are also available. For example, noise measurement up to 26GHz is proposed for noise figure or noise parameters extraction. Furthermore, we have solutions for spectral characterization up to 75GHz and for sub nanosecond time domain measurement.
For on wafer devices, two probe stations can be coupled with measurement equipments
A manual probe station for 4'' wafer size can be used for characterizations up to 40GHz.
A semi-automatic probe station with 12'' (300 mm) chuck size is used for wide band characterization up to 110GHz.