Microwave Instruments

 Many test and measurement instruments both in time and frequency domains are available on the    platform. These include :

• Vector network analyzers (handheld, 20GHz, 40GHz, 65GHz and 110GHz broadband coaxial)
• Spectrum analyzers (20, 40GHz and up to 90GHz using an external harmonic mixer solution)
• Power-meter up to 110GHz
• Noise figure analyzer up to 26GHz with calibrated noise source
• Analog signal generators or synthesizers up to 110GHz
• High speed digital oscilloscopes 6GHz (real time) and 20GHz (equivalent time)
• Wideband coaxial programmable impedance tuner 18GHz

•  Universal coaxial test fixture (20GHz, 40GHz and 65GHz) for on board devices
•  Probe station for on wafer or on chip RF devices

        
         On wafer RF measurements                                                         RF test setup 

Based on these equipements, users can implement standard or custom measurement solutions and thus access some various parameters or features:

• S parameter from 30 KHz up to 110GHz
• Non-linear compression and intermodulation behaviors
• Spectral analysis and phase noise measurement up to 90GHz
• Noise figure up to 26GHz, noise parameters up to 18GHz
• Sub-nanosecond time domain reflectometry (TDR, TDT, differential)
• High speed signals up to 6GHz in real time and 20GHz in equivalent time
• Characterization of high-frequency materials (DK and losses)
• …​​​​​​​