Physical and Electrical characterization

Thanks to a large group of competitive scientific equipments, IMEP-LAHC has a great knowledge in measurements allowing the study of electronic devices and of associated materials and technologies as well.
 

• I-V (Current vs Voltage) and C-V (Capacitance vs Voltage) measurements at a low frequency (from 0.01Hz to 110 MHz), at room temperature, but at high temperature (up to 600K) and at low temperature (down to 10K) too.
• Measurements on transport properties (Hall, Magnetic-resistance...)
• Noise Measurements at low frequency (up to 10 MHZ)
• Measurements in a nano-scaled field (Atomic force microscopy (AFM) with its different electrical modes)