IMEP-LAHC, INPG - Minatec Bâtiment BCAi, room A367, 3 Parvis Louis Néel, CS 50257, 38016 Grenoble, France
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Physique, fiabilité et fluctuations dans les composants de la nanoélectronique
1. Physique et fiabilité des composants MOS de la micro-électronique
Caractérisation et modélisation des TMOS, Dégradation et fiabilité des diélectriques de grille ultra-minces, Nouveaux diélectriques à forte permittivité, effets quantiques, effets balistiques, nouveaux matériaux….
2. Fluctuations et bruit dans les composants électroniques
Caractérisation et modélisation des TMOS en bruit basse fréquence, Nouvelles technologies à SiGe, FD-SOI, GAA, nanofils, dispersion technologique, variabilité statique et dynamique, transistors organiques…
Gérard Ghibaudo, Fellow IEEE in 2013, was born in France in 1954. He graduated from Grenoble Institute of Technology in 1979, obtained the PhD degree in Electronics in 1981 and the State Thesis degree in Physics from the same University in 1984. He became associate researcher at CNRS in 1981 where he is now Director of Research at CNRS. He was Director of IMEP-LAHC Laboratory located at MINATEC-INPG center from 2007 to 2013. During the academic year 1987-1988 he spent a sabbatical year at Naval Research Laboratory in Washington, DC (USA) where he worked on the characterization of MOSFETs. His main research activities were or are in the field of electronics transport, oxidation of silicon, MOS device physics, fluctuations and low frequency noise and dielectric reliability. Dr. G. Ghibaudo has surpervised over 100 PhD students in his career. He was co-founder of the First European Workshop on Low Temperature Electronics (WOLTE 94) and organizer of 20 Workshops/Summer School during the last 35 years. Dr. G. Ghibaudo is also member of the Editorial board of Solid State Electronics and associate editor of Journal of Active and Passive Electronic Component. During his career he has been author or co-author of over 500 articles in International Refereed Journals, 700 communications and 76 invited presentations in International Conferences and of 32 book chapters. Dr. G. Ghibaudo features 808 items, 9276 citations, H index of 39 in Web of Science.
mise à jour le 20 mars 2019